Scanning Electron Microscopy (SEM) and Energy Dispersive X-ray (EDX) microanalysis
The Geo Laboratory at the Natural History Museum (NHM-UiO) is equipped with a Hitachi S–3600N Scanning Electron Microscope (SEM), installed in 2004, which is suitable for high-resolution imaging of geological materials (minerals, microfossils) and semi-quantitative X-ray microanalysis of both conductive and non-conductive specimens.
The Hitachi S–3600N SEM can be operated in two modes:
- High-vacuum (HV) mode (< 1 Pa). Used for high-resolution imaging and semi-quantitative X-ray microanalysis of conductive samples or coated samples.
- Variable pressure (VP) mode (10–200 Pa). This allows observation of non-conductive samples in their natural state or in a wet condition, without the need for coating.
- High-resolution secondary (SE) and backscattered (BSE) electron detectors.
- Bruker XFlash® 5030 energy dispersive X-ray detector (EDX), running on Quantax 400 (Esprit 1.9), for semi-quantitative elemental analysis and hyperspectral mapping, with <127 eV FWHM at MnKα energy resolution.
- Large chamber accommodating samples up to 150 mm in diameter and ~50 mm in height.
- A 5-axis motorized stage with eucentric tilt (0 – 52°, depending on sample size) and 360° rotation.
Examples of images
Sample Preparation Equipment
Electrically insulating samples may be coated with a thin layer of conducting material, e.g. carbon, gold or some other metal alloy. The choice of material depends on the data to be acquired; carbon is most desirable for elemental analysis, while metal coatings are most effective for high-resolution imaging.
- Agar Auto Carbon Coater, designed to evaporate conducting carbon layers on the SEM/EDX samples to prevent charging effects.
- Jeol Fine Coat Ion Sputter, JFC-1100 with a PtPd metal alloy target.
The SEM is available for rent with or without an operator. Prices are in NOK excl. VAT.
|Internal users with operator||400 NOK/hour|
|External users without operator||800 NOK/hour|
|External users with operator||1500 NOK/hour|